MetHPM: Metrology for highly-parallel manufacturing

2015–2018          Tools for measuring large-scale, fine-feature printed electronics

New metrology is needed to improve the accuracy and efficiency of highly-parallel manufacturing of advanced products in various new areas.

Project improves large-substrate, fine feature manufacturing processes such as roll-to-roll
printed electronics by delivering inline metrology tools, traceability and standards.

MIKES develops lateral chromatic imaging for traceable topography measurement on a moving substrate and methods for monitoring flexible substrates to verify registration.methpm.png

More information: Antti Lassila, tel. +358 40 767 8584, antti.lassila(at)

Project website: