Services and competences in nanometrology
VTT MIKES has extensive expertise in nanoscale measurements. The main advantage of these measurements at VTT MIKES is the traceability and reliability of the measurement results. Moreover, we always provide realistic uncertainty estimates for the measurements and our calibration services are internationally accepted.
Solving customer problems often requires more versatile know-how than only performing single measurements. Problem solving contains for instance answering the following questions: What is the problem? What method would it take to solve it? What level of precision is required? At VTT MIKES, we have a wide range of different measurement methods available in the nanometre and micrometre range to solve the customer problems.
The size of customer projects varies from individual measurement services to customer-funded research projects and large co-financed research projects. For larger research projects, we can help with applying for funding (e.g. Business Finland) or we can put together a bigger consortium to solve the problem (EU H2020).
Services in the nanometre scale at VTT MIKES.
|AFM (atomic force microscopy)|| – Basic surface profile measurement|
– Metrological AFM (MAFM) for calibration of transfer standards
for high-accuracy measurements
– EFM (Electric Force Microscopy)
– Measurements in liquids
|White light interference microscopy |
– Surface profile measurement
– Surface roughness
– Measurement of film
thickness (~XX µm)
– DLS (Dynamic light scattering)
|Stylus profilometry||– Surface profile|
– Surface roughness
|Scatteromety ||– Laser diffractometry for gratings||Flatness interferometry|||
Research projects in nanometrology
VTT MIKES participates actively in national and international nanometrology research projects. Currently, three projects are ongoing and a couple of applications are waiting for funding decision.
Ongoing and finished research projects in nanometrology.
| – Development of large scale AFM
– Coordinated by VTT MIKES
|– Development of calibration standards based
on DNA nano-origami structures in co-
operation with Aalto University
|– Traceable methods to determine
the focal spot size in XCT
|– Humidity controlled chamber for MAFM
– Studies on how different humidity conditions
affect AFM measurements
– Studying mechanical properties of nanowires
in co-operation with University of Helsinki
|– Standardisation of concentration
measurements of extracellular
vesicles for medical diagnoses
(in co-operation with EV-core)
|– Development of calibration methods for
Stroposcopic Scanning White Light Interference
(SSWLI) microscopes in coperation with
University of Helsinki
|– Development of scatterometry measurements|
|– Traceability to measurements below one |
nanometre by refined optical interferometry
|– Bringing traceability to nanoparticle
– Methods for traceable measurement of number
density of nanoparticle (SCAR) in co-operation
with Tampere University of Technology
- Virpi Korpelainen, Senior Research Scientist, tel.
+358 50 410 5504, email Virpi.Korpelainen(at)vtt.fi
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