MIKES Publications

Length: services glossary

DimVIM English-Finnish Length services classification

B. Hemming, Measurement Traceability and Uncertainty in Machine Vision Applications, J6/2007

Hemming, Measurement Traceability and Uncertainty in Machine Vision Applications, MIKES publication J6/2007, Espoo 2007, 110 p.

V-P. Esala, Pituuden vertailumittaus D6, loppuraportti, MIKES Publication J03/2004

J. Halttunen, Tampere University of Technology, Coriolis-mittarin vertailumittaus, syksy 2002. Interlaboratory comparison of a Coriolis flowmeter, Autumn 2002., MIKES Publication J04/2004

A. Lassila, Northern European Comparison: Calibration of gauge blocks by mechanical comparison, final report, Mikes publication J4/2002

B. Hemming, Euromet project 533, High Precision Roundness, Final Report, MIKES Julkaisu J04/2001

A. Lassila, National standards for dimensional and optical quantities, MIKES Publication J10/1997

Antti Lassila, Traceable Nanometrology

Antti Lassila, MIKES' Combined white light and 633 nm interferometer

M. Merimaa, K. Nyholm, M. Vainio and A. Lassila, Traceability of laser Frequency Calibrations at MIKES, IEE Trans. Instrum. Meas. 56 (2007), pp. 500-504

B. Hemming, E. Ikonen, and M. Noorma, Measurement of Aperture Diameters using an Optical Coordinate Measuring Machine, International Journal of Optomechatronics, 1 (2007) 297–311.

B. Hemming, A. Fagerholm, and A. Lassila, High-accuracy Automatic Machine Vision Based Calibration of Micrometers, Meas. Sci. Technol. 18 (2007) 1655-1660

V. Korpelainen and A. Lassila, Calibration of a commercial AFM: traceability for a coordinate system, Measurement science and technology, 18, p 395-403, 2007

L.-S. Ma, S. Picard, M. Zucco, J.-M. Chartier, L. Robertsson, P. Balling, P. Kren, J. Qian, Z. Liu, Ch. Shi, M. V. Alonso, G. Xu, S. L. Tan, K. Nyholm, J. Henningsen, J. Hald, W. R. C. Rowley, G. P. Barwood, and R. Windeler, Absolute frequency measurement of the R(12) 26–0 and R(106) 28–0 transitions in 127I2 at  = 543 nm, IEEE Trans. Instrum. Meas. 55, 876–880 (2006)

M. Vainio, M. Merimaa and K. Nyholm, Modulation transfer characteristics of injection-locked diode lasers, Opt. Commun. 267 (2006) pp. 455-463

M. Vainio, M. Merimaa, and K. Nyholm, amplifier for femtosecond frequency comb measurements near 633 nm, Applied Physics B, 81 (2005) 1053-1057

M. Vainio, M. Merimaa, and E. Ikonen, Iodine spectrometer based on a 633-nm transmission-grating diode laser, Measurement Science and Technology, 16 (2005) 1305-1311

V. Korpelainen and A. Lassila, Acoustic method for determination of the effective temperature and refractive index of air in accurate length interferometry, Optical Engineering 43 (2004), p. 2400-2409

S. Picard, L. Robertsson, L.-S. Ma, K. Nyholm, M. Merimaa, T. E. Ahola, P. Balling, P. Kren, J.-P. Wallerand, Comparison of 127I2-stabilized frequency-doubled Nd:YAG lasers at the Bureau International des Poides et Mesures, Applied Optics, Vol. 42, No.6 (2003) 1019-1028

S. Picard, L. Robertsson, L.-S. Ma, Y. Millerioux, P. Juncar, J.-P. Wallerand, P. Balling, P. Kren, K. Nyholm, M. Merimaa, T. E. Ahola, and F.-L. Hong, Results from international comparisons at the BIPM providing a world-wide reference network of 127I2 stabilized frequency-doubled Nd:YAG lasers, IEEE Trans. Instrum. Meas. 52, 236–239 (2003)

K. Nyholm, M. Merimaa, T. Ahola, and A. Lassila, Frequency stabilization of a diode-pumped Nd:YAG laser at 532 nm to iodine by using third-harmonic technique, IEEE Trans. Instrum. Meas. 52, 284–287 (2003)

M. Merimaa, T. Lindvall, I. Tittonen, and E. Ikonen, All-optical atomic clock based on coherent population trapping in 85Rb, Journal of the Optical Society of America B (accepted)

Björn Hemming, Heikki Lehto, Calibration of dial indicators using machine vision, Measurement Science and Technology 13 (2002) 45-49

M. Merimaa, P. Kokkonen, K. Nyholm, and E. Ikonen, A portable laser frequency standard at 633 nm with a compact external-cavity diode laser, Metrologia 38 (2001) 311-318

A. Zarka, A. Abou-Zeid, D. Chagniot, J.-M. Chartier, O. Cíp, J.-F. Cliche, C. S. Edwards, F. Imkenbe, International comparison of eight semiconductor lasers stabilized on 127I2 at l =633nm, Metrologia 37 (2000) 329-339

A. Lassila. K. Riski. J. Hu. T. Ahola. S. Naicheng. L. Chengyang. P. Balling. J. Blabla. L. Abramova, International comparison of He-Ne lasers stabilized with 127I2 at l=633 nm: Comparison of the fift, Metrologia 37 (2000) 701-707

H. Simonsen, J. Hu, and K. Nyholm , International comparison of He-Ne lasers stabilized with I2 at   543 nm (December 1999): Northern European lasers, Metrologia 37, 709–714 (2000).

P. Toivanen, F. Manoochehri, P. Kärhä, E. Ikonen and A. Lassila, Method for characterisation of filter radiometers, Applied Optics 38 (1999) 1709-1713

M. Merimaa, H. Talvitie and E. Ikonen, Iodine-stabilized diode laser at 633 nm: Effects of optical feedback, IEEE Transactions on Instrumentation and Measurement 48 (1999) 587-591

E. Ikonen, P. Toivanen and A. Lassila, A new optical method for high-accuracy determination of aperture area, Metrologia 35 (1998) 369-372

J. Hu, T. Ahola, E. Ikonen and K. Riski, Frequency shifts of iodine stabilized He-Ne lasers at higher harmonic order stabilization, IEEE trans. Instrum. Meas. 46 (1997) 186-190

E. Ikonen, A. Lassila and P. Toivanen, A new optical method for high-accuracy determination of aperture area, in Newrad 97, Tucson, Arizona, USA 1997

J. Hu, K. Riski, A. Chartier, J.-M. Chartier and S. Picard, Comparison of 127I2 -stabilized He-Ne lasers at 633 nm between the MIKES and the BIPM, Metrologia 34 (1997) 417-419

L. Abramova, V. Baratov, V. Fedorin, L. Khavinson, E. Latigneva, K. Riski, E.Ikonen and A. Lassila, Comparison of length standards between the CMA and the VNIIM, Metrologia 33 (1996) 29-33

J. Hu, E. Ikonen and K. Riski, Experimental Investigation on Power Shift of Iodine Stabilized He-Ne Lasers at 633 nm, Metrologia 33 (1996) 467-473

J. Hu, T. Ahola, K. Riski and E. Ikonen, Development of iodine stabilized He-Ne lasers at MRI, Measurement 16 (1995) 187-193

J. Hu, E. Ikonen and K. Riski, Frequency Shift of Iodine Absorption Components Caused by a Small Amount of (127)I(129)I, Metrologia 31 (1995) 389-394

A. Lassila, E. Ikonen and K. Riski, Interferometers for calibration of length standards, Optical Engineering 34 (1995) 2619-2622

J. Hu, E. Ikonen and K. Riski, On the nth harmonic locking of the iodine stabilized He-Ne laser, Optics Communications 120 (1995) 65-70

A. Lassila, E. Ikonen and K. Riski, Interferometer for calibration of graduated line scales with a moving CCD camera as a line detector

E. Ikonen and K. Riski, Gauge-block interferometer based on one stabilized laser and a white-light source, Metrologia 30 (1993) 95-104

P. Andersson, J. Levén and B. Hemming, Hot rolling tests with steel bars and silicon nitride rolls, Journal of Materials Processing Technology, 209 (2009) 884-893

V. Ahtee, M. Merimaa, and K. Nyholm, Single-frequency synthesis at telecommunication wavelengths, Conference on Precision Electromagnetic Measurements, June 8–13, 2008, Broomfield, USA, Conference Digest, pp. 172–173.

V. Ahtee, M. Merimaa, and K. Nyholm, Fiber-based acetylene-stabilized laser, Conference on Precision Electromagnetic Measurements, June 8–13, 2008, Broomfield, USA, Conference Digest, pp. 180–181.

M. Merimaa, V. Ahtee, and K. Nyholm, Absolute frequency measurement of an iodine-stabilized 543-nm He-Ne laser with modulation-synchronized phase-locked loop for improved frequency counting, Conference on Precision Electromagnetic Measurements, June 8–13, 2008, Broomfield, USA, Conference Digest, pp. 312–313.

V. Korpelainen, A. Iho, S. Seppä and A. Lassila, High accuracy laser diffractometer: Angle-scale traceability by error separation method with a grating, NanoScale 2008, 22.-23. September 2008, Turin, Italy.

Matus, A. Niessner, P. Balling, P. Kren, P. Klapetek, A. Lassila, A. Yacoot, G. B.Picotto, M. Pisani, J. Flügge, U. Kuetgens, M. Celik, R. Hamid, Optical interferometry with 10 pm level accuracy - the Project Nanotrace, NanoScale 2008, 22.-23. September 2008, Turin, Italy.

J. Garnaes, F. Meli, E. Buhr, H.-U. Danzebrink, L. Koenders, J. Haycocks, K.H. Jackson, A. Yacoot, M. Pisani, P. Klapeteck, R. Dixson, T. Vorburger, I.Misumi, T. Kurosawa, G.S. Peng, J.-A. Kim, V. Korpelainen, A. Lassila and S. Gao, The role of 2D gratings for accurate dissemination of the nanometre, NanoScale 2008, 22.-23. September 2008, Turin, Italy.

M. Matus, E. Prieto, P. Balling, O. Kruger, J. Hald, G.B . Picotto, S. Ducourtieux, F. Meli, A. Lassila, H. Piree, R. Fira, R. Johansson, T. Yandayan, Interferometric calibration of nanometric displacement actuators, NanoScale 2008, 22.-23. September 2008, Turin, Italy.

V. Ahtee, K. Nyholm, A. Lassila, and M. Merimaa, Single-frequency synthesis at telecommunication wavelengths, Proceedings of the VIII Finnish Optics Days, May 3–4, 2007, Lappeenranta, Finland, p. 49

V. Korpelainen, A. Iho, A. Lassila and K. Nyholm, Characterisation of grating pitch by laser diffraction, in Nanotech in northern Europe 2007, 28. – 29. March 2007, Helsinki, Finland

V. Korpelainen, M. Sarjala, M. Alava, A. Lassila, E. Seppälä, L. Kärkkäinen and A. Kärkkäinen, Dynamical nonlinearities of piezoelectric materials, in Nanotech in northern Europe 2007, 28. – 29. March 2007, Helsinki, Finland

V. Korpelainen, A. Iho, A. Lassila and K. Nyholm, Characterisation of grating pitch by laser diffraction, Nanotech in northern Europe 2007, 28. – 29. March 2007, Helsinki, Finland

M. Merimaa, K. Nyholm and M. Vainio, Traceability of laser frequency calibrations at MIKES, in 2006 Conference on Precision Electromagnetic Measurements Digest (CPEM2006), Turin, Italy, July 9-14, 2006, pp. 436-437

V. Korpelainen and A. Lassila, Calibration and traceability of a commercial AFM at MIKES, in Nanotechnology in northern Europe 2006, 16. - 18. May 2006, Helsinki, Finland

M. Merimaa, K. Nyholm and M. Vainio, Frequency comb generator for cor calibration of stabilized lasers at MIKES, in Northern Optics 2006, Technical Digest, Bergen, Norway, June 14-16, 2006, p. 131

A. Lassila, V. Korpelainen and L. Mihaljov, Refractive index of air compensation by acoustic method for plane mirror interferometer, in Proceedings of NanoScale 2006, 24. – 25 April, Bern, Swizerland

P. Andersson, M. Wild, J. Levén and B. Hemming, Transfer of surface texture from silicon nitride rolls to stainless steel wire in cold-rolling, Journal of Materials Processing Technology 173 (2006) 394-400

L. Stenlund, K. Riski and V. Korpelainen, Surface studies of weights with AFM, Proceedings of NanoScale 2006, April 24-25, 2006, METAS, Switzerland

M. Merimaa, K. Nyholm, and M. Vainio, Frequency comb generator for calibration of laser frequency standards, IEEE LEOS Summer Topicals 2005, Optical frequency & time measurement and generation, San Diego, USA, July 25-27, 2005, pp. 33-34

V. Korpelainen, A. Lassila, Quantitative microscopy at MIKES - traceability of AFM measurements, in Northern Europe, Helsinki, Finland, 26-28 April 2005

V.-P. Esala, B. Hemming, K. Nyholm, and A. Lassila, MIKES’ facility for calibration of commercial laser interferometers, in Proc. of Euspen 2005 Conference, Montpellier 8.- 12.5.2005, 4 p

M. Vainio, M. Merimaa, K. Nyholm, and E. Ikonen, External-cavity diode laser based spectrometer for absolute determination of iodine lines around 633 nm, in Proc. SPIE/Optical Sensing and Spectroscopy, Dublin, Ireland, April 4-6, 2005

M. Merimaa, K. Nyholm, and M. Vainio, MIKES frequency comb generator and absolute frequency measurements of iodine-stabilized lasers, in Proceedings of 12th International Conference on Metrology, Lyon, France, June 20-23, 2005

M. Vainio, M. Merimaa, and K. Nyholm, Use of injection locking for reducing optical feedback effects and residual amplitude modulation in wavelength modulation spectroscopy, in proceedings of 5th International Conference on Tunable Diode Laser Spectroscopy 2005, July 11-15, 2005, Florence, Italy, 2005, p.100

M. Merimaa, K. Nyholm, and M. Vainio, Measuring optical frequencies at 10^-13 level: absolute frequency determinations of laser frequency standards, in Proceedings of the Finnish optics Days 2005, Jyväskylä, May 12-13, 2005

K. Nyholm, M. Merimaa, and M. Vainio, MIKES' femtosecond frequency comb generator, in Proceedings of the Finnish optics Days 2005, Jyväskylä, May 12-13, 2005

M. Vainio, M. Merimaa, and K. Nyholm, Iodine spectrometer for absolute frequency determination of iodine hyperfine components near 633 nm, in Proceedings of the XXXIX Annual Confrence of the Finnish Physical Society, Espoo, March 17-19, 2005, p. 386.

A. Lassila, V. Korpelainen, B. Hemming, I. Palosuo, Recent developments at nanometre scale metrology at MIKES, Nanotechnology in Northern Europe, Helsinki, Finland, 26-28 April 2005

M. Vainio, M. Merimaa, K. Nyholm, and E. Ikonen, External-cavity diode laser based spectrometer for absolute determination of iodine lines around 633 nm, Optical Sensing and Spectroscopy, in Proc. SPIE Opto-Ireland 2005. Eds. G. D. O’Sullivan, H. J. Byrne, E. McGlynn, A. G. Ryder, and B. D. MacCraith, 2005, pp. 331-339

M. Vainio, M. Merimaa, and K. Nyholm, Optical amplifier for laser frequency measurements near 633 nm with a frequency comb generator, Proceedings of the Finnish optics Days 2004, Jyväskylä, May 12-13, 2005

V. Korpelainen and A. Lassila, Traceable quantitative microscopy at MIKES, Proceedings of the XXXIX annual conference of the Finnish physical society, Espoo, Finland, March 17-19, 2005, p 212.

V. Korpelainen, K. Nyholm, A. Lassila, Traceability of SPM measurements, Scandinavian Scanning Probe Microscopy Conference and Users Meeting 2005, Espoo, Finland, 29 April 2005

Ilkka Palosuo, Björn Hemming, Antti Lassila, Design of a calibration machine of optical two-dimensional length standards, In proceedings of euspen International Topical Conference, Glasgow, 2004

Björn Hemming, Anu Tanninen, High-precision automatic machine vision based calibration of micrometers, In proceedings of euspen International Topical Conference, Glasgow, 2004

V. Korpelainen and A. Lassila, Self-calibration of non-linearities of laser interferometer and capacitive sensor combination for an interferometrically traceable AFM device, Proceedings of 4th international conference of the European society for precision engineering and nanotechnology, euspen, Glasgow, Scotland, May 31 – June 2, 2004, p 256.

A. Lassila, Updated performance and uncertainty budjet of MIKES' line scale interferometer, Proceedings of 4th international conference of the European society for precision engineering and nanotechnology, euspen, Glasgow, Scotland, May 31 – June 2, 2004, p 258.

A. Lassila and V. Korpelainen, Design of an interferometrically traceable AFM at MIKES, Proceedings of NanoScale 2004, March 25-26, 2004, Braunschweig, Germany.

V. Korpelainen and A. Lassila, Studies on acoustic method for determination of the refractive index of air, Proceedings of NanoScale 2004, March 25-26, 2004, Braunschweig, Germany.

V. Korpelainen and A. Lassila, Online determination of the refractive index of air by ultrasonic speed of sound measurement for interferometric displacement measurement, Proceedings of ODIMAP IV, 4th Topical meeting on Optoelectronic Distance/Displacement Measurement and Application, Oulu, Finland, June 16 18, 2004, p. 72.

M. Merimaa, K. Nyholm, V. Ahtee, and M. Vainio, Frequency comb generation and absolute optical frequency measurements at 532 nm, Proceedings of the 6th Finnish Optics Days, May 6-7, 2004, Turku, Finland, p. 42.

K. Nyholm and M. Merimaa, Realisation of the metre by an optical frequency comb, Proceedings of the 6th Finnish Optics Days, May 6-7, 2004, Turku, Finland, p. 46.

V. Korpelainen and A. Lassila, Development of an interferometrically traceable AFM at MIKES, Proceedings of the XXXVIII annual conference of the Finnish physical society, March 18-20, 2004, Department of Physical Sciences, University of Oulu, Report series in physical sciences 25, p 137.

M. Merimaa, K. Nyholm, V. Ahtee, and M. Vainio, Absolute frequency measurements of 127I2 hyperfine components around 532 nm, XIX International Conference on Atomic Physics, Abstracts of Contributed Papers, July 25-30, 2004, Rio de Janeiro, Brazil, p. 149.

A. Lassila, J. Jokela, M. Poutanen and Xu Jie, Absolute calibration of quartz bars of väisälä interferometer by white light gauge block interferometer, in Proc. XVII IMEKO World Congress, June 22-27, 2003, Dubrovnik, Croatia, 1886-1890.

Björn Hemming, Ilkka Palosuo, Antti Lassila, Design of calibration machine for optical two-dimensional lenght standards, in Proc. of Spie Optomechatronical Systems III Vol 4902, pp 670-677

J. Unkuri, J. Manninen and A. Lassila, Accurate linear thermal expansion coefficient determination by interferometry, in Proc. XVII IMEKO World Congress, June 22-27, 2003, Dubrovnik, Croatia, 221-224.

V. Korpelainen, B. Hemming, H. Lehto and A. Lassila, A new acoustic method for determination of the effective air temperature for length interferometers, In proceedings of euspen International Topical Conference, Aachen, Germany, 2003, p 431

V. Korpelainen and A. Lassila, A new acoustic method for the determination of the refracticve index of air, In proceedings of Northern Optics 2003, TKK-F-A822, p 68

M. Merimaa, V. Ahtee, M. Vainio and K. Nyholm, Developement of a frequecy comb generator for precision optical frequency measurements, In proceedings of Northern Optics 2003, TKK-F-A822, p 82

V. Korpelainen and A. Lassila, An acoustic method for the determination of the refractive index of air for length intererometers, Proceedings of the XXXVII Annual Conference of the Finnish Physical Society, March 20–22, 2003, Helsinki, Finland, University of Helsinki, Report Series in Physics HU-P-265, p. 273.

K. Nyholm and M. Merimaa, Optical frequency comb generator for metrology, Proceedings of the XXXVII Annual Conference of the Finnish Physical Society, March 20–22, 2003, Helsinki, Finland, University of Helsinki, Report Series in Physics HU-P-265, p. 383.

M. Merimaa, Compact frequency stabilized lasers, in Proc. SPIE vol. 4647/Functional Integration of Opto-Electro-Mechanical Devices and Systems, San Jose, USA, January 19-25, 2002, pp. 22-35

S. Picard, L. Robertsson, L.-S. Ma, K. Nyholm, M. Merimaa, T. E. Ahola, P. Balling, P. Kren, J.-P. Wallerand, Results from international comparisons at the BIPM: providing a world wide reference network of 127I2-stabilized frequency-doubled Nd:YAG laser, in proceedings of the Conference on Precision Electromagnetic Measurements, Ottawa, Canada, 16 - 21 June 2002, pp. 212-213

K. Nyholm, M. Merimaa, T. Ahola, and A. Lassila, Frequency stabilization of a diode-pumped Nd:YAG laser at 532 nm to iodine by using third-harmonic technique, in proceedings of the Conference on Precision Electromagnetic Measurements, Ottawa, Canada, 16 - 21 June 2002, pp. 474-475

K. Nyholm, T. E. Ahola, M. Merimaa, and A. Lassila, , Optical frequency standard at 532 nm, Proceedings of the XXXVI Annual Conference of the Finnish Physical Society, Joensuu, Finland, March 14–16, 2002, University of Joensuu, Department of Physics, Selected papers 7, p. 73.

T. E. Ahola, M. Merimaa, and K. Nyholm, Frequency stabilization of a diode-pumped Nd:YAG laser at 532 nm to iodine by using third-harmonic t, in Proceedings of the 4th Finnish Optics Days, April 20-21, 2001, Tampere, Finland, p. P5.

A. Lassila and J. Unkuri, Investigation of non-linearity of gauge block interferometers, in Proceedings of the EUSPEN - 2nd International Conference, vol. 1, 286-289

M. Merimaa, P. Kokkonen, K. Nyholm, and E. Ikonen, A portable laser frequency standard at 633 nm with a compact external-cavity diode laser, in Proceedings of the XXXV Annual Conference of the Finnish Physical Society, March 22-24, 2001, Joensuu, Finland, University of Joensuu, Department of Physics, Selected papers 7, p. 73.

T. E. Ahola, M. Merimaa, and K. Nyholm, Iodine-stabilized frequency-doubled Nd:YAG laser for length metrology, in Proceedings of the XXXV Annual Conference of the Finnish Physical Society, March 22-24, 2001, Jyväskylä, Finland, University of Jyväskylä, Department of Physics, Research Report No. 5/2001, p. 62

M. Merimaa, P. Kokkonen, K. Nyholm, and E. Ikonen, A compact iodine stabilized external-cavity diode laser at 633 nm with a novel transmission grating, Conference on Precision Electromagnetic Measurements, May 14–19, 2000, Sydney, Australia, Conference Digest, pp.679–680.

K. Nyholm, T. Ahola, J. Hu, and E. Ikonen, Stabilization and frequency measurements of green He-Ne lasers, Proceedings of the XXXIV Annual Conference of the Finnish Physical Society, March 9–11, 2000, Espoo, Finland, Helsinki University of Technology, Publications in Engineering Physics, TKK-F-A797, p. 69.

M. Merimaa, H. Talvitie, J. Hu and E. Ikonen, Iodine Stabilised Diode Laser at 633 nm, in Proc. of CPEM 98, Washington DC, USA 1998

T. Ahola, J. Hu and E. Ikonen, A Digital Control System for Iodine Stabilized Lasers, in Proc. of CPEM 98, Washington DC, USA 1998

A. Lassila, P. Tallgren, K. Riski and E. Ikonen, Interferometric refractometer with a variable-length vacuum cylinder, in Proc. SPIE 3477 (1998) 54-61.

A. Lassila, J. Hu and K. Riski, The facilities for calibration of gauge blocks and line scales at MIKES, in Proc. of Måleteknik & Kalibrering, Nyborg. Denmark 1997

J. Hu, Frequency shift of Iodine stabilised He-Ne laser at higher order harmonic stabilisation, in Proc. of CPEM 96, Braunschweig, Germany, 1996

K. Riski, E. lkonen, J. Luukkainen and J-M Saari, Interferometric calibration of long gauge blocks, in Proc. of 4th International Symposium on Dimensional Metrology in Production and Quality Control,

E. Ikonen, A. Lassila, J. Luukkainen and K. Riski, Interferometric Length Measurements, in Proc. SPIE 1756 (1992) 86-97

E. Seppälä, V. Korpelainen, K. Ojasalo, M. Sarjala, M. Alava, A. Lassila and A. Manninen, Dynamical Nonlinearities in Piezoelectric Materials, in Ferroelectrics, Multiferroics, and Magnetoelectrics, edited by J.F. Scott, V. Gopalan, M. Okuyama, and M. Bibes (Mater. Res. Soc. Symp. Proc. 1034E, Warrendale, PA, 2007), 1034-K04-11.

V. Korpelainen, M. Sarjala, M. Alava, A. Lassila, E. Seppälä, L. Kärkkäinen and A. Kärkkäinen, Dynamical nonlinearities of piezoelectric materials, Nanotech in northern Europe 2007, 28. – 29. March 2007, Helsinki, Finland